Industry / Technologies

Diffraction and Scattering

X-ray scattering is a commonly used method for non-destructed determination on matters, such as: crystalline structures, chemical compositions, and different physical properties. The information of the samples is utilized from the intensity, position and shape of scattered X-rays.

Scattering includes two parts: elastic and inelastic scatterings. The elastic one is also called diffraction, which is mainly related to the long range order crystalline structures of a matter. The diffraction can be used to analyze molecular’ structures and types. The inelastic scattering is usually applied on the density、thickness、particle size and shape of powder particles and thin films.

Methods Analysis Representative beamline
X-ray single crystal diffraction Single crystal structure、Orientation、Defect TLS07A1TLS13A1TLS17B1TPS09A
X-ray powder diffraction Phase determination TLS01C2TLS07A1TPS19A
Grazing incident X-ray diffraction Thin film structure、crystalline orientation TLS07A1TLS13A1TLS17B1
(Non-)Specular X-ray scattering thickness、interface roughness TLS07A1TLS13A1TLS17B1
X-ray small angle scattering Particle size、particle shape TLS13A1TLS23A1TPS13ATPS25A
Protein Crystallography Protein structure TLS13B1TLS15A1TPS05ATPS07A
Inelastic X-ray scattering Surface and dynamic analysis TPS41A、SP12U1