X-ray scattering is a commonly used method for non-destructed determination on matters, such as: crystalline structures, chemical compositions, and different physical properties. The information of the samples is utilized from the intensity, position and shape of scattered X-rays.
Scattering includes two parts: elastic and inelastic scatterings. The elastic one is also called diffraction, which is mainly related to the long range order crystalline structures of a matter. The diffraction can be used to analyze molecular’ structures and types. The inelastic scattering is usually applied on the density、thickness、particle size and shape of powder particles and thin films.