研究設施 / 實驗站

End Stations for Condensed Matter/Surface Science Studies - Soft X-ray, VUV & IR
Photoelectron Emission Microscopy Station

Beamline : BL05B2 (EPU)
Contact : Der-Hsin Wei , ext. 7218, dhw@nsrrc.org.tw
Yao-Jane Hsu, ext. 7218, yjhsu@nsrrc.org.tw

Photoelectron Emission Microscopy is an imaging technique that utilizes secondary electron emitted from surface upon x-ray irradiation to form a frame of image. High resolution surface and sub-surface image with elemental, chemical and magnetic contrast can be acquired.

Major instrumentation

  • Omicron FOCUS-IS PEEM

Experimental technique

  • Microscopy, μ-XAS

Capabilities

  • Energy Rang: 60 ~ 1400eV
  • Polarization: Linear, left/right circular, elliptical polarized Spatial Resolution (UV/SR source): Better than 0.15/0.2μm
  • Sample Requirement: Solid, UHV compatible, 5~10mm in diameter

Useful Information

Schematic drawing of PEEM Station
Omicron FOCUS-IS PEEM Optics
PEEM Station at EPU
AUV image of NiFe ring with 0.5µm Line Width