Detailed analysis of the distribution of charge carriers and the identification of the valence, spin state, and orbital occupations of metal ions are necessary to understand the origin of the interesting transport properties of materials. Synchrotron-based spectroscopies are crucial to investigate those rich phenomena, since synchrotron radiation can generate light with continuous energy, high brightness, and extreme high intensity which is at least 10 orders of magnitude higher than what conventional X-ray tubes could produce. To investigate the rich physic properties, there are several powerful methods, such as near-edge X-ray absorption fine structure (NEXAFS), photoemission spectroscopy (XPS), and x-ray scattering (elastic/inelastic, REXS/RIXS), because they are able to provide important information about the electronic structures, such as the d-d Coulomb interaction U, the band dispersion width W, the charge transfer energy Δ, the crystal and ligand field, and the spin, charge, orbital long/short range ordering.