2020同步年報

Facility Status 101 near edge structure (XANES) for studying the structural change of a flexible supercapacitor with an external force, (3) grazing-incidence small-angle X-ray scattering (GISAXS)/ GIWAXS for organic photovoltaic thin films formed in situ during spin-coating and thermal annealing, (4) GISAXS for silicate films formed in situ at the air-water interface, and (5) a microbeam SAXS/WAXS mode for structural map- ping of textures. The schematic drawing of the beamline is shown in Fig. 4 . TPS 20A Two Dimensional X-ray Diffraction Beamline For an investigation of any scientific great thought that might be possible through structural analysis of the ma- terials, it is an important issue to investigate the chemical and physical properties. X-ray diffraction is the major and efficient technique to obtain structural information. The two-dimensional X-ray diffraction beamline includes two important methods of material analysis: powder X-ray diffraction (PXRD) and grazing-incidence X-ray diffrac- tion (GIXRD). Both techniques are mature and popular in widespread scientific use, such as semiconductor science, material science, physics, chemistry, geoscience and phar- maceutical science. The two-dimensional X-ray diffraction beamline at TPS will have high throughput and be a world-leading material- science facility. The main optics compises a collimating mirror, a water-cooled DCM with Si (111) crystals and a focusing mirror. The X-ray beam will be focused at the sample posi- tion (45 m) with beam size 300 × 300 μm 2 , and have ad- justable X-ray energy in the range between 10 and 30 keV. The endstation consists of a multi-function sample stage and a large-area detector. A capillary sample-rotation stage is designed to collect high-quality powder-diffraction data and to eliminate the effect of texturing. Another stage, a high-precision hexapod stage can meet both demands to perform grazing-incidence diffraction experiments and sample environment device setting. For the detection system, an area detector of large sensitive area (311 × 327 mm 2 ) and small pixel size (75 × 75 μm 2 ) is sufficient to meet the needs of versatile researchers in all aspects of study. The major functions of the two-dimensional X-ray diffrac- tion beamline are listed as follows. •Grazing-incidence diffraction: Diffraction data measure- ments for thin film, bulk and pellet samples. • Powder-diffraction studies: Structural characterization or Rietveld refinement for crystalline samples. •High-throughput studies: Quick measurements for a large quantity of powder samples. • In-situ studies and non-ambient environments: Measuring diffraction datasets during varied non-ambient environ- ments, such as heating/cooling, increasing/decreasing pres- sure, various gas flows and charge/discharge of a battery. The schematic drawing of the beamline and the design drawing of the endstation are shown in Fig. 5 . TPS 32A Tender X-ray Absorption Spectroscopy Beamline The tender X-ray absorption spectroscopy beamline in TPS covers a unique energy range (1.7–10 keV), allowing the collection of the spectra at K-edges for chemical elements from Si (1839 eV) to Zn (9659 eV) and L-edges for the second-row transition metals. Even the M-edges of some rare-earth and 5d elements can be measured. As the ener- Fig. 5 : (above) Optical layout of beamline TPS 20A . (right) The preliminary design of the endstation consists of a rotation stage, a hexapod stage and a large- area detector. gy range of tender X-rays is not easily accessible with a grating monochromator, two DCMs, with a pair of either Si(111) or InSb(111), will be installed in this beamline. The double-bounce high-order harmonics-rejection