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Diffraction and Scattering
X-ray scattering is a commonly used method for non-destructed determination on matters, such as: crystalline structures, chemical compositions, and different physical properties. The information of the samples is utilized from the intensity, position and shape of scattered X-rays.
Scattering includes two parts: elastic and inelastic scatterings. The elastic one is also called diffraction, which is mainly related to the long range order crystalline structures of a matter. The diffraction can be used to analyze molecular’ structures and types. The inelastic scattering is usually applied on the density、thickness、particle size and shape of powder particles and thin films.
Methods Analysis Representative beamline
X-ray single crystal diffraction Single crystal structure、Orientation、Defect BL07A1BL13A1BL17A1BL17B1
X-ray powder diffraction Phase determination BL01C2BL17A1
Grazing incident X-ray diffraction Thin film structure、crystalline orientation BL07A1BL17B1
(Non-)Specular X-ray scattering thickness、interface roughness BL07A1BL17A1BL17B1
X-ray small angle scattering Particle size、particle shape BL13A1BL23A1
Protein Crystallography Protein structure BL13A1BL13B1BL13C1SP12B1
Inelastic X-ray scattering Surface and dynamic analysis BL05A1SP12U1