中心簡介 / 同仁通訊錄

奈米科學小組


姓名: 陳家浩( Chia-Hao Chen )
分機: 7325
電子郵件: chchen@nsrrc.org.tw
學歷:
  • 柏林科技大學 物理博士(2003)
  • 國立清華大學 原子科學碩士 (1994)
  • 東海大學 物理學士 (1992)
經歷:
  • 同步輻射研究中心 副研究員 (2015 迄今)
  • 同步輻射研究中心 助理研究員 (2003-2015)
負責實驗站:
  • TLS 09A1,掃描式光電子能譜顯微術實驗站
研究領域:
  • 實驗固態物理
  • 半導體物理
  • 光電子能譜顯微術
代表作:
  • “Does scandium resemble transition or rare earth metals when it is grown on silicon surfaces?” H. W. Shiu, L. Y. Chang, J. L. Lou, C. P. Wu, and C.-H. ChenJ. Appl. Phys. 113(2013)043701
  • “Graphene as tunable transparent electrode material on GaN: Layer-number-dependent optical and electrical properties” Hung Wei Shiu, Lo Yueh Chang, Kai-Hsuan Lee, Hung-Ying Chen, Shangjr Gwo, and Chia-Hao ChenAppl. Phys. Lett. 103(2013)081604
  • “Preparation and Characterization of a Highly Ordered 1-dodecanethiol Monolayer on Bare Si(111) Surface”, Jie Ling Lou, Hung Wei Shiu, Lo Yueh Chang, Chia Ping Wu, Yun-Liang Soo, and Chia-Hao ChenLangmuir 27(2011)3436
  • “Scanning Photoelectron Microscopy for Novel Nanomaterials Characterization”, Jau-Wern Chiou and Chia-Hao Chen, Chapter 4 in “X-rays in nanoscience” Editors: Jinghua Guo, Wiley-VCH Verlag, Weinheim, Germany. ISBN: 978-3-527-32288-6 (2010)
  • “Absence of Fermi-Level Pinning at Cleaved Nonpolar InN Surfaces”, Chung-Lin WuHong-Mao LeeCheng-Tai KuoChia-Hao Chen, and Shangjr GwoPhys, Rev. Lett., 101(2008)106803
  • “X–ray photoemission microscopy for nanocharacterization of advanced materials”, Chia-Hao Chen, Ruth Klauser, Stefan Heun, Yoshio Watanabe and Michael Zharnikov, a book chapter in “Beam Injection Based Nanocharacterization of Advanced Materials”, Editors: G. Salviati, T. Sekiguchi, S. Heun and A. Gustafsson, ISBN: 978-81-308-0226-8
  • “Exposure of Monomolecular Lithographic Patterns to Ambient: An X-ray Photoemission Spectromicroscopy Study”, C.-H. Chen, M.-L. Huang, S.-C. Wang, R. Klauser, A. Shaporenko, and M. Zharnikov, J. Phys. Chem. B 110(2006)17878
  • “Valence band discontinuity at the GaN/SiC(0 0 0 1) heterojunction studied in situ by synchrotron-radiation photoelectron spectroscopy”, C.-H. Chen, L. Aballe, R. Klauser, T. U. Kampen, and K. Horn, J. Elect. Spec. Relat. Phenom. 144-147(2005)425